Using XRF to Measure Coating Thickness & Perform Material Analysis

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We'd like to invite you to a very special workshop being hosted by Devarsh Shah, technical manager at Fischer Technology, Inc., this September 3rd, 2025 at our office in Oakville, Ontario, Canada.

Devarsh will be discussing X-ray fluorescence (XRF) technology for use in a variety of applications, including coating thickness measurement, solution analysis - including solution contaminants, gold, silver, precious metals, and general material analysis.

This will be a great opportunity to see first-hand how XRF analysis can precisely determine material compositions and coating thicknesses, including:

• Incoming Quality Acceptance such as brass, bronze, steel, zamak, etc.
• Bath composition and contaminants
• Coating thickness analysis, single or multilayer coatings for QC
• Regulatory Compliance such as RoHS, Controlled hazardous metals such as Cd, Hg, Pb, Br, Cr, etc.
• Precisely control gold concentration, silver concentration, and how XRF can help in jewelry manufacturing

You won't want to miss out on this rare opportunity to see our versatile X-Ray solutions up close and discover if any of your application needs can be solved before any investment!

Bring along a material sample for FREE testing during the event.

Date: September 3, 2025Time: 10:00am - 2:00pm

Location: 1275 North Service Rd W, Oakville, ON L6M 2W2 Canada

RESERVE YOUR SEAT TODAY BY SUBMITTING A FREE TICKET

Questions? Email us at: Y3VzdG9tZXJfc29sdXRpb25zIHwgZmlzY2hlci10ZWNobm9sb2d5ICEgY29t

Also check out other Workshops in Oakville.