2025 MAF Workshop

Monday & Tuesday, August 4 & 5: Lectures and instrument demos in the Molecular Analysis Facility at UW. Space is limited!

About this Event

The MAF Characterization Workshop includes lectures and instrument demonstrations.

The demonstrations on MAF instruments will provide application examples for much of the material covered in the workshop lectures. The workshop is taught by experienced MAF staff, faculty and vendors. Attendees will learn the capabilities of various surface analysis methods, compositional analysis, and electron microscopy imaging as well as how to intelligently review the data from these characterization tools. The workshop will focus on the following methods:

• X-ray Photoelectron Spectroscopy (XPS/ESCA)
• Secondary Ion Mass Spectrometry (SIMS)
• Scanning Probe Microscopy (SPM/AFM)
• X-Ray Diffraction (XRD)
• Scanning Electron Microscopy (SEM)
• Transmission Electron Microscopy (TEM)
• Raman
• EDS

Note: To pay with a budget number (worktag), please email YXJpYWggfCB1dyAhIGVkdQ== with your information.

Monday, August 4


🕑: 08:30 AM - 09:00 AM
Registration, Coffee & Pastries – Architecture Building, ARC 160
Host: Ariah Kidder

🕑: 09:00 AM - 09:15 AM
Intro. to Characterization and the MAF
Host: Prof. Lara Gamble

🕑: 09:15 AM
Xray Photoelectron Spectroscopy (XPS)/Electron Spectroscopy for Chem Analysis
Host: Prof. Lara Gamble

🕑: 10:00 AM - 10:15 AM
Coffee break
Host: Ariah Kidder

🕑: 10:15 AM - 11:00 AM
ToF-SIMS: Learning about surfaces by blowing them up
Host: Dr. Daniel Graham

🕑: 11:00 AM - 11:30 AM
Introduction to XRD for materials characterization
Host: Dr. Samantha Young

🕑: 11:30 AM - 12:00 PM
Introduction to Vibrational Spectroscopy
Host: Dr. Tim Pollock

🕑: 12:00 PM - 02:00 PM
Lunch

🕑: 02:00 PM - 02:15 PM
Raman, AFM and XRD, TEM, and SEM Instrument Demonstrations IN THE MAF

🕑: 02:15 PM - 03:15 PM
Demos - Round 1

🕑: 03:15 PM - 03:30 PM
Break

🕑: 03:30 PM - 04:30 PM
Demos - Round 2

Tuesday, August 5


🕑: 08:30 AM - 09:00 AM
Coffee & pastries – Architecture Building, ARC 160
Host: Ariah Kidder

🕑: 09:00 AM - 10:00 AM
Improved EDS spectral resolution
Host: Michael Hjelmstad, Oxford Instruments America, Inc.

Info: Improved EDS spectral resolution: Why it is important at low energy and the benefits to semiconductor and battery applications

🕑: 10:00 AM - 10:15 AM
Coffee Break
Host: Ariah Kidder

🕑: 10:15 AM - 11:00 AM
An Overview of Atomic Force Microscopy Methods
Host: Dr. Rajiv Giridharagopal

🕑: 11:00 AM - 11:45 AM
Transmission Electron Microscopy & Sample Preparation Techniques for TEM & SEM
Host: Ellen Lavoie

🕑: 11:45 AM - 02:00 PM
Lunch

🕑: 02:00 PM
Raman, AFM and XRD, TEM, and SEM Instrument Demonstrations IN THE MAF

🕑: 02:00 PM - 03:00 PM
Demos - Round 1

🕑: 03:00 PM - 03:15 PM
Break

🕑: 03:15 PM - 04:15 PM
Demos - Round 2

🕑: 04:15 PM
End of workshop


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